Strobe Edge

Strobe Edge

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  • Author: Io Sakisaka
  • Publisher: Viz
  • ISBN: 9781421550688
  • Category : Comics & Graphic Novels
  • Languages : en
  • Pages : 174

Ninako Kinoshita is torn between Ren Ichinose, the most popular student in school, who seems to have no interest in girls but talks to her, and Daiki, her friend from middle school, who expresses a romantic interest that she does not share.


AGP System Architecture

AGP System Architecture

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  • Author: Dave Dzatko
  • Publisher: Addison-Wesley Professional
  • ISBN: 9780201700695
  • Category : Computers
  • Languages : en
  • Pages : 373

The Accelerated Graphics Port (AGP) interface is a platform bus specification that enables high-performance graphics capabilities, 3-D, and video-over networks as well as on individual PCs. This book provides an overview of the technology, a detailed description of the specification, a discussion of AGP Pro, and a tutorial for mastering AGP.


Strobe Edge

Strobe Edge

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  • Author: Io Sakisaka
  • Publisher: VIZ Media LLC
  • ISBN: 9781421553139
  • Category : Comics & Graphic Novels
  • Languages : en
  • Pages : 216

A heartwarming story about first love that’s one of the most hotly anticipated new shojo series among U.S. fans. What is love, anyway? Ninako Kinoshita’s friends tell her it’s one thing, but Ninako wonders what this mysterious feeling really is. When she meets Ren Ichinose, the handsome, enigmatic guy that all the girls worship, her life takes an unexpected turn. With just a few words and a smile, he changes her world... Resolving to focus on his girlfriend, Mayuka, during her time of need, Ren buries his growing feelings for Ninako. Meanwhile, Ninako sees a different side of Ando when they run into his ex-girlfriend. What happened to Ando in the past, and how was Ren involved? Reads R to L (Japanese Style) for teen audiences.


Constraining Designs for Synthesis and Timing Analysis

Constraining Designs for Synthesis and Timing Analysis

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  • Author: Sridhar Gangadharan
  • Publisher: Springer Science & Business Media
  • ISBN: 1461432693
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 226

This book serves as a hands-on guide to timing constraints in integrated circuit design. Readers will learn to maximize performance of their IC designs, by specifying timing requirements correctly. Coverage includes key aspects of the design flow impacted by timing constraints, including synthesis, static timing analysis and placement and routing. Concepts needed for specifying timing requirements are explained in detail and then applied to specific stages in the design flow, all within the context of Synopsys Design Constraints (SDC), the industry-leading format for specifying constraints.


Strobe Edge 1

Strobe Edge 1

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  • Author: Io Sakisaka
  • Publisher:
  • ISBN: 9788415513230
  • Category : Juvenile Fiction
  • Languages : es
  • Pages : 192


Strobe Edge

Strobe Edge

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  • Author: Io Sakisaka
  • Publisher: VIZ Media LLC
  • ISBN: 9781421553153
  • Category : Comics & Graphic Novels
  • Languages : en
  • Pages : 216

A heartwarming story about first love that’s one of the most hotly anticipated new shojo series among U.S. fans. What is love, anyway? Ninako Kinoshita’s friends tell her it’s one thing, but Ninako wonders what this mysterious feeling really is. When she meets Ren Ichinose, the handsome, enigmatic guy that all the girls worship, her life takes an unexpected turn. With just a few words and a smile, he changes her world... Ninako is thrilled that she’s in the same class as Ren for the new school year, but is their closeness due to the fact that he only sees her as a friend? Meanwhile, Ninako’s friend Sayuri faces an old flame’s ardor… Will her past love stay in the past? Reads R to L (Japanese Style) for teen audiences.


Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

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  • Author: Jose Luis Huertas Díaz
  • Publisher: Springer Science & Business Media
  • ISBN: 0387235213
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 298

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.


Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits

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  • Author: Yichuang Sun
  • Publisher: IET
  • ISBN: 0863417450
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 389

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective.


Strobe Edge

Strobe Edge

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  • Author: Io Sakisaka
  • Publisher: VIZ Media LLC
  • ISBN: 9781421552705
  • Category : Comics & Graphic Novels
  • Languages : en
  • Pages : 192

Being in love can light up your life… A sweet love story that will warm your heart! What is love, anyway? Ninako Kinoshita’s friends tell her it’s one thing, but Ninako wonders what this mysterious feeling really is. When she meets Ren Ichinose, the handsome, enigmatic guy that all the girls worship, her life takes an unexpected turn. With just a few words and a smile, he changes her world... Ando confesses his feelings to Ninako and tells her to give up on Ren—especially because there are limits to loving someone who already has a girlfriend. Meanwhile, Ren finds it harder and harder to deny his attraction to Ninako… But will Ren choose to do anything about it, particularly when his girlfriend, Mayuka, needs him? Reads R to L (Japanese Style) for teen audiences.


System-on-Chip Test Architectures

System-on-Chip Test Architectures

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  • Author: Laung-Terng Wang
  • Publisher: Morgan Kaufmann
  • ISBN: 9780080556802
  • Category : Technology & Engineering
  • Languages : en
  • Pages : 896

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.